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THE SEPARATION OF KALPHA ₁ AND KALPHA ₂ COMPONENTS IN X-RAY LINE PROFILE ANALYSIS.RAMESH NARAYAN.1977; J. APPL. CRYSTALLOGR.; DENM.; DA. 1977; VOL. 10; NO 4; PP. 351-352; BIBL. 7 REF.Article

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A GENERAL METHOD FOR LOCATING THE X-RAY SOURCE POINT IN KOSSEL DIFFRACTION.BIGGIN S; DINGLEY DJ.1977; J. APPL. CRYSTALLOGR.; DENM.; DA. 1977; VOL. 10; NO 5; PP. 376-385; BIBL. 31 REF.Article

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PHOTOMETRY OF NON-INTEGRATED WEISSENBERG PHOTOGRAPHS.GALDECKI Z; GLOWKA ML.1976; ROCZ. CHEM.; POLSKA; DA. 1976; VOL. 50; NO 7-8; PP. 1387-1394; ABS. POL. RUSSE; BIBL. 4 REF.Article

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